Semiconductor Plasma Equipment

PE-200 RIE Reactive Ion Etcher

The PE-200 (RIE) is a high-precision reactive ion etcher engineered for semiconductor microfabrication. It delivers uniform, controllable etching for silicon, SiN, SiO2 and advanced microstructures.

  • High-precision microfabrication etching.
  • Versatile for Si, SiN and SiO2.
  • Stable vacuum and RF control.

Tech Specs

Model PE-200 (RIE)
Etch Method Reactive Ion Etching (RIE)
Maximum Substrate Size Up to 200 mm wafers (configurable)
RF Power Up to 1000 W (adjustable)
Base Vacuum < 5 x 10^-3 Pa (typical)
Process Gases CF4, SF6, CHF3, O2, Ar and mixtures
Chamber Material Stainless steel with interior coating
Control Interface PLC with touchscreen (optional)

Key Features

  • High-Precision Etch Control

    Precise RF and process gas control enables accurate, repeatable etch profiles and critical dimension control for advanced semiconductor patterning and MEMS fabrication.

  • Wide Material Compatibility

    Optimized recipes accommodate silicon, silicon nitride, silicon dioxide and a variety of specialty materials, enabling flexible process development across multiple device types.

  • Stable Vacuum Performance

    Robust pumping and valve architecture maintain low base pressure and stable process environments, ensuring uniform etch rates and reduced particle contamination risks.

  • User-Friendly Operation Interface

    Intuitive control with PLC and optional touchscreen simplifies recipe management, process monitoring, and rapid adjustments to reduce setup time and operator training needs.

  • Compact, Serviceable Cabinet Design

    Ergonomic cabinet layout and accessible service points minimize maintenance downtime and streamline routine chamber cleaning, gas line replacement and RF component checks.

  • Scalable for R&D and Production

    Modular configuration supports both research-level flexibility and production-level throughput, allowing users to scale process capabilities as volume or complexity increases.

Plasma Cleaning Process

  • Plasma Generation

    Process gas is energized and converted into a reactive plasma containing ions, electrons, and radicals.

  • Plasma–Surface Interaction

    High-energy plasma species reach the material surface and interact with contaminants at the molecular level.

  • Chemical Reaction

    Reactive ions and radicals break down organic residues and surface contaminants through controlled chemical reactions.

  • Volatilization

    The reaction products are converted into volatile compounds and enter the gas phase.

  • Removal from Surface

    Gaseous by-products desorb from the surface and are evacuated, leaving a clean, activated material surface.