A high-density ICP CVD plasma deposition system engineered for uniform, low-contamination thin film growth on wafers and substrates. Ideal for semiconductor, MEMS, and specialty coating applications requiring precise process control.

| Wafer Size | Up to 200 mm (8 inch) substrates |
| Chamber Volume | Compact vacuum chamber suitable for single-wafer processing |
| ICP Power | 0–2000 W (adjustable) |
| RF Bias Power | 0–500 W (process bias control) |
| Process Pressure | 0.1–100 Pa (≈0.75–750 mTorr) |
| Base Vacuum | < 5 × 10^-6 Torr |
| Temperature Range | Ambient to 400 °C (substrate heater) |
| Deposition Rate | Typical 5–200 nm/min (process dependent) |
| Uniformity | ±3% across usable wafer area |
| Process Gases | SiH4, NH3, N2, O2, Ar and other specialty precursors |
| Control Interface | PLC with touchscreen and recipe management |
English
Japanese
Korean
Rogatus ad ultimum admissusque in consistorium ambage nulla praegressa inconsiderate